Determination of Diffusion Coefficients with Quantitative X-Ray Microanalysis at High - Spatial Resolution
| Periodical | Defect and Diffusion Forum (Volumes 323 - 325) |
|---|---|
| Main Theme | Diffusion in Materials - DIMAT 2011 |
| Edited by | I. Bezverkhyy, S. Chevalier and O. Politano |
| Pages | 61-67 |
| DOI | 10.4028/www.scientific.net/DDF.323-325.61 |
| Citation | Raynald Gauvin et al., 2012, Defect and Diffusion Forum, 323-325, 61 |
| Online since | April, 2012 |
| Authors | Raynald Gauvin, Nicolas Brodusch, Pierre Michaud |
| Keywords | Electron Microscopy, Inter-Diffusion Coefficients, X-Ray Microanalysis |
| Price | US$ 28,- |
This paper present the determination of concentration profiles of an Mg Al diffusion couple that was obtained with a high resolution field emission scanning electron microscope, the Hitachi SU-8000 equipped with a SDD EDS detector. From these concentration profiles, the inter-diffusion coefficient is determined with the Boltzmann-Matano technique. The advantages and disadvantages of working at high and low beam energy for quantitative x-ray microanalysis are highlighted. The f ratio method is used in this work to convert the x-ray intensities into composition.