Paper Title:

Determination of Diffusion Coefficients with Quantitative X-Ray Microanalysis at High - Spatial Resolution

Periodical Defect and Diffusion Forum (Volumes 323 - 325)
Main Theme Diffusion in Materials - DIMAT 2011
Edited by I. Bezverkhyy, S. Chevalier and O. Politano
Pages 61-67
DOI 10.4028/www.scientific.net/DDF.323-325.61
Citation Raynald Gauvin et al., 2012, Defect and Diffusion Forum, 323-325, 61
Online since April, 2012
Authors Raynald Gauvin, Nicolas Brodusch, Pierre Michaud
Keywords Electron Microscopy, Inter-Diffusion Coefficients, X-Ray Microanalysis
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Abstract

This paper present the determination of concentration profiles of an Mg Al diffusion couple that was obtained with a high resolution field emission scanning electron microscope, the Hitachi SU-8000 equipped with a SDD EDS detector. From these concentration profiles, the inter-diffusion coefficient is determined with the Boltzmann-Matano technique. The advantages and disadvantages of working at high and low beam energy for quantitative x-ray microanalysis are highlighted. The f ratio method is used in this work to convert the x-ray intensities into composition.