Paper Title:
26Al Tracer Diffusion in Nominally Undoped Single Crystalline α-Al2O3
| Periodical | Defect and Diffusion Forum (Volumes 323 - 325) |
|---|---|
| Main Theme | Diffusion in Materials - DIMAT 2011 |
| Edited by | I. Bezverkhyy, S. Chevalier and O. Politano |
| Pages | 75-79 |
| DOI | 10.4028/www.scientific.net/DDF.323-325.75 |
| Citation | P. Fielitz et al., 2012, Defect and Diffusion Forum, 323-325, 75 |
| Online since | April, 2012 |
| Authors | P. Fielitz, Günter Borchardt, S. Ganschow, R. Bertram |
| Keywords | 26Al, Aluminium Diffusion, Nominally Undoped Alumina, SIMS |
| Price | US$ 28,- |
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Abstract
Simultaneous 18O and 26Al tracer diffusion experiments were performed in nominally undoped single crystalline α-Al2O3. The results clearly show that the bulk diffusivity of aluminium is much higher than the bulk diffusivity of oxygen in nominally undoped alumina. Comparing the 26Al tracer diffusivities of Ti doped (300-400 wt. ppm Ti) and nominally undoped single crystalline α-Al2O3 one finds that the aluminium bulk diffusivity is insensitive to the Ti doping.
