Paper Title:
Correction Method for the X-Ray Diffraction Data Obtained by Thin Film Diffractometer
  Abstract

  Info
Periodical
Defect and Diffusion Forum (Volumes 53-54)
Edited by
R.A. Weeks and D.L. Kinser
Pages
439-444
DOI
10.4028/www.scientific.net/DDF.53-54.439
Citation
I. Yasui, T. Nanba, "Correction Method for the X-Ray Diffraction Data Obtained by Thin Film Diffractometer", Defect and Diffusion Forum, Vols. 53-54, pp. 439-444, 1987
Online since
January 1987
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Price
$32.00
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