Paper Title:
On the Structure of Ge-Associated Defect Centers in Irradiated High Purity GeO2 and Ge-Doped SiO2 Glasses
  Abstract

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Periodical
Defect and Diffusion Forum (Volumes 53-54)
Edited by
R.A. Weeks and D.L. Kinser
Pages
469-476
DOI
10.4028/www.scientific.net/DDF.53-54.469
Citation
T.E. Tsai, D.L. Griscom, E.J. Friebele, "On the Structure of Ge-Associated Defect Centers in Irradiated High Purity GeO2 and Ge-Doped SiO2 Glasses", Defect and Diffusion Forum, Vols. 53-54, pp. 469-476, 1987
Online since
January 1987
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