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Compound Formation and Interfacial Instability in the Au-Cu-Sn System at Low Temperature

Journal Defect and Diffusion Forum (Volume 59)
Volume Diffusion Processes in High Technology Materials
Edited by D. Gupta, A.D. Romig and M.A. Dayananda
Pages 271-0
DOI 10.4028/www.scientific.net/DDF.59.271
Citation J.F. Roeder et al., 1991, Defect and Diffusion Forum, 59, 271
Authors J.F. Roeder, M.R. Notis, J.I. Goldstein
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