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Diffusion Processes in High Technology Materials

Defect and Diffusion Forum Volume 59

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• p225 Tracer Diffusion of ⁶⁰Co and ⁶³Ni in Amorphous NiZr Alloy   [ 263 K ]
  Authors: K. Hoshino, Robert S. Averback, H.Thomas Hahn, Steven J. Rothman
• p233 Tracer Diffusion in Pure and Boron-Doped Ni₃Al   [ 155 K ]
  Authors: K. Hoshino, Steven J. Rothman, Robert S. Averback
• p239 The Behavior of Transition Metals in Silicon during Annealing Transients   [ 536 K ]
  Authors: D.R. Sparks, N.S. Alvi, Mysore A. Dayananda
• p253 Suppression of Vacancy Diffusion during Short Range Ordering   [ 363 K ]
  Authors: B. Fultz, L. Anthony
• p261 Crystallization and Diffusion Studies in Amorphous Ni-Zr Thin Films   [ 379 K ]
  Authors: G.V. Chandrashekhar, D. Gupta, S.B. Newcomb, F.M.H. Spit, K.N. Tu
• p271 Compound Formation and Interfacial Instability in the Au-Cu-Sn System at Low Temperature   [ 326 K ]
  Authors: J.F. Roeder, M.R. Notis, J.I. Goldstein