Electromigration in Permalloy Thin Films |
| Journal |
Defect and Diffusion Forum (Volumes 95 - 98) |
| Volume |
Diffusion in Materials |
| Edited by |
M. Koiwa, K. Hirano, H. Nakajima and T. Okada |
| Pages |
271-278 |
| DOI |
10.4028/www.scientific.net/DDF.95-98.271 |
| Citation |
H. Tanabe et al., 1993, Defect and Diffusion Forum, 95-98, 271 |
| Authors |
H. Tanabe, M. Kitada |
| Keywords |
Electromigration, Magnetic Disk, Magnetic Tape, Magnetoresistive Head, Mean Time to Failure, Permalloy Film |
| Full Paper |
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