Paper Title:
Application of Analytical Electron Microscopy to Diffusivity Measurement in Ni-Al System
  Abstract

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Periodical
Defect and Diffusion Forum (Volumes 95-98)
Edited by
M. Koiwa, K. Hirano, H. Nakajima and T. Okada
Pages
579-586
DOI
10.4028/www.scientific.net/DDF.95-98.579
Citation
M. Watanabe, Z. Horita, T. Fujinami, T. Sano, M. Nemoto, "Application of Analytical Electron Microscopy to Diffusivity Measurement in Ni-Al System", Defect and Diffusion Forum, Vols. 95-98, pp. 579-586, 1993
Online since
January 1993
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Price
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