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Deep Level Transient Spectroscopic Analysis of Annealing Process of Iron Ion Implanted Gallium Arsenide

Journal Defect and Diffusion Forum (Volumes 95 - 98)
Volume Diffusion in Materials - DIMAT 1992
Edited by M. Koiwa, K. Hirano, H. Nakajima and T. Okada
Pages 995-1000
DOI 10.4028/www.scientific.net/DDF.95-98.995
Citation M. Taniwaki et al., 1993, Defect and Diffusion Forum, 95-98, 995
Authors M. Taniwaki, H. Koide, Yasunori Hayashi
Keywords Deep-Level Transient Spectroscopy, Fe-Implantation, GaAs
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