Papers by keyword «Dislocations»
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Surface Stress Problem in Heterogeneous Mechanochemical Reactions
Authors: Emmanuel M. Gutman
Keywords: Chemical Potential, Dislocations, Electrochemical Kinetics, Mechanochemical Reactions, Surface Energy, Surface Stress
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Strain Broadening Caused by Dislocations
Authors: Tamás Ungár
Keywords: Dislocations, Profile Analysis, Strain Broadening
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X-Ray and Neutron Analysis of the Dislocation Content in Plastically Deformed β-Brass
Authors: D. Breuer, P. Klimanek
Keywords: Dislocations, Line Shape Analysis, Neutron Diffraction, Plastic Deformation, X-Ray Diffraction (XRD), β-Brass
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Influence of Multiple Martensitic Transitions on the Crystal Structure of Austenite Single Crystals
Authors: V. Bondar, V.E. Danil'chenko
Keywords: Austenite, Diffraction Spot, Dislocations, Hardness, Martensite, Misorientation, Single Crystal, Structure Defect, Twin
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Physical Vapor Growth and Characterization of High Conductivity 1.4 Inch 4H-SiC Bulk Crystals
Authors: Stephan G. Müller, Robert Eckstein, Wolfgang Hartung, Dieter Hofmann, M. Kölbl, Gerhard Pensl, Erwin Schmitt, Arnd Dietrich Weber, Albrecht Winnacker
Keywords: Dislocations, Dopant Incorporation, Etch-Pit-Density, Micropipe, Stress Birefringence
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The Effects of Growth Conditions in Dislocation Density in SiC Epi-Layers Produced by the Sublimation Epitaxy Technique
Authors: A. Kakanakova-Georgieva, Mike F. MacMillan, Shigehiro Nishino, Rositza Yakimova, Erik Janzén
Keywords: Dislocations, Sublimation Epitaxy Growth, Surface Morphology
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The Formation of Super-Disolcation/Micropipe Complexes in 6H-SiC
Authors: J. Giocondi, Gregory S. Rohrer, Marek Skowronski, V. Balakrishna, G. Augustine, H. McD. Hobgood, R.H. Hopkins
Keywords: Atomic Force Microscopy, Dislocations, Extended Defects, Micropipe
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Extended Defects in SiC and GaN Semiconductors
Authors: P. Pirouz
Keywords: Defect, Dislocations, Galium Nitride (GaN), Inversion Domains, Polytypes, Silicon Carbide SiC, Stacking Faults
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The Origin of Triangular Surface Defects in 4H-SiC CVD Epilayers
Authors: W.L. Zhou, P. Pirouz, J. Anthony Powell
Keywords: Dislocations, Epitaxy, Polytypism, Surface Defects, Transmission Electron Microscopy (TEM)
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Gaseous Etching for Characterization of Structural Defects in Silicon Carbide Single Crystals
Authors: J. Anthony Powell, David J. Larkin, Andrew J. Trunek
Keywords: Characterization, Defect, Dislocations, Etching, Step Bunching, Transformation
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