Papers by keyword «Interface» and «Transmission Electron Microscopy (TEM)»
-
TEM and Photoluminescence Investigations of InGaAs/GaAs Quantum Well Layers
Authors: C. Frigeri, A. Brinciotti, D.M. Ritchie, A. Di Paola
Keywords: Critical Thickness, InGaAs/GaAs SQW, Interface, Misfit Dislocation, Misoriented Substrates, Photoluminescence (PL), Transmission Electron Microscopy (TEM)
-
Reactions at Ceramic-Metal Interfaces in Capacitor-Discharge Joined Ceramics
Authors: Servet Turan
Keywords: Coating, Interface, Joining, Reaction Layers, Titanium, Transmission Electron Microscopy (TEM), Zirconia
-
Structure of Triple Line in Reactive Ag-Cu-Ti/SiC Wetting System
Authors: M. Nomura, T. Ichimori, Chihiro Iwamoto, S. Tanaka
Keywords: Brazing, Chemical Reactions, Interface, SIM, Titanium Silicide, Transmission Electron Microscopy (TEM), Wetting
-
Void Shapes in the Si (111) Substrate at the Heteroepitaxial Thin Film / Si Interface
Authors: J. Jinschek, Ute Kaiser, W. Richter
Keywords: Interface, MBE Growth, Si Outdiffusion, Transmission Electron Microscopy (TEM), Void
-
TEM Examination of the Interface between Bioglass®/Polyethylene Composites and Human Osteoblast Cells In Vitro
Authors: Jie Huang, L. Di Silvio, M. Kayser, William Bonfield
Keywords: Apatite, Bioglass® Composite, Cell Culture, Interface, Polyethylene (PE), Transmission Electron Microscopy (TEM)
-
Al-AlN Composites Elaborated by Squeeze Casting
Authors: M. Chedru, G. Boitier, Jean Vicens, Jean-Louis Chermant, B.L. Mordike
Keywords: Al-AlN, Interface, Metal Matrix Composite (MMC), Squeeze Casting, Transmission Electron Microscopy (TEM)
-
Microstructure Evolution of Alloy 600 during Dry Oxidation
Authors: J. Panter, Bernard Viguier, Eric Andrieu
Keywords: Alloy 600, Dislocation, Interface, Mechanical Property, Microhardness, Microstructure, Ni-Cr, Transmission Electron Microscopy (TEM)
-
Fracture of SIC Fiber-Reinforced Glass Composites
Authors: Dong Won Shin, Kwang Jin Kim
Keywords: Fiber Hardness, Interface, Mechanical Property, PEELS, SiC Fiber/Pyrex, Transmission Electron Microscopy (TEM)
-
Transmission Electron Microscopy Studies of Lattice-Mismatched Semiconductor Heterostructures Used for Integrated Optoelectronic Devices
Authors: G. Patriarche
Keywords: Dislocation, Epitaxy, III-V Semiconductor, II-VI Semiconductors, Interface, Lattice Mismatched Heterostructures, Semiconductor Heterostructures, Transmission Electron Microscopy (TEM), Wafer Bonding
-
The Influence of SrTiO3/Si Interface Treatment by Sr and Ti on Structural Properties of SrTiO3 Thin Films
Authors: M. Špankova, Š. Chromik, K. Sedláčková, I. Vávra, Š Gaži, P. Kúš
Keywords: Crystallinity, Interface, Silicon, SrTiO3, Transmission Electron Microscopy (TEM)
|
Next 10 Keywords
|
