Stresses and Interfacial Structure in Metal Films and Multilayers of Nanometre Thickness |
| Journal |
Journal of Metastable and Nanocrystalline Materials (Volume 19) |
| Volume |
Nanodiffusion |
| Edited by |
D.L. Beke |
| Pages |
129-152 |
| DOI |
10.4028/www.scientific.net/JMNM.19.129 |
| Citation |
Olivier Thomas et al., 2004, Journal of Metastable and Nanocrystalline Materials, 19, 129 |
| Online since |
January, 2004 |
| Authors |
Olivier Thomas, Stephane Labat, T. Bigault, Patrice Gergaud, F. Bocquet |
| Keywords |
Bending Test, Dislocations, Elasticity, Multilayer Thin Films, Strain, Stresses, Surface Segregation, X-Ray Diffraction (XRD) |
| Full Paper |
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