Paper Title:
Preparation and Characterization of ZnSe/SiO2 Nanocomposite
  Abstract

Semiconductor ZnSe nanocrystals (NCs)-doped SiO2 glasses (designated as ZnSe/SiO2 nanocomposites) were prepared successfully by using sol-gel method and in-situ growth technique. The nanocomposite was characterized by X-ray diffraction (XRD) patterns, UV-Vis absorption spectra and X-ray Photoelectron Spectroscopy (XPS). The XRD results show that ZnSe NCs is zinc blende structure and the mean size is smaller than 5nm in diameter. UV-Vis absorption spectra reveals that the size of the NCs is influenced by synthesis conditions such as doping concentration and thermal treatment, and XPS together with XRD can prove that silica matrix plays an important role in enhancing the NCs’ stability.

  Info
Edited by
M. Gupta and Christina Y.H. Lim
Pages
71-74
DOI
10.4028/www.scientific.net/JMNM.23.71
Citation
F. Kong, X. Yao, M. Q. Wang, H. Jiang, Y. P. Wang, "Preparation and Characterization of ZnSe/SiO2 Nanocomposite", Journal of Metastable and Nanocrystalline Materials, Vol. 23, pp. 71-74, 2005
Online since
January 2005
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