Synthesis, Structural, Electrical, Magnetic and Dielectric Spectroscopic Characterization of C-Er2Si2O7
|Periodical||Journal of Nano Research (Volume 17)|
|Main Theme||Journal of Nano Research Vol. 17|
|Citation||Shahid Ameer et al., 2012, Journal of Nano Research, 17, 85|
|Online since||February, 2012|
|Authors||Shahid Ameer, Ahmad Faraz, Asghari Maqsood, Nasir M. Ahmad|
|Keywords||Dielectric Property, Electrical Property, Electronic Materials, Magnetic Parameters, Remanance (Mr), Saturation Magnetization (Ms), X-Ray Diffraction (XRD)|
The Polymorphic Er2Si2O7 Is Synthesized by Solid State Double Sintering Method. Structural and Morphological Characterizations Have Been Performed Using X-Ray Diffraction (XRD) and Scanning Electron Microscopy (SEM). The Electrical Characterization Has Been Performed by Two Probe Method as a Function of Temperature. the Dielectric Spectroscopic Measurements of Polymorphic Er2Si2O7 Are Performed in the Temperature Range 300-555 K and Frequency Range 3 kHz to 1 MHz. the dc Electrical Transport Data Are Analyzed According to Mott’s Variable-Range Hopping. The ac Conductivity σac(ω) Is Obtained through the Dielectric Spectroscopic Measurements. the ac Conductivity Obeys Power Law which Can Be Expressed as σac (ω) = B ωs, where S Is Slope and it Determines the ac Electrical Transport Phenomenon. the ac Electrical Transport Data and its Variation with Temperature in this Rare Earth Formulation Are Well Discussed. the Magnetic Behavior of Synthesized Material Is Analyzed and Confirmed that Material Have Non-Magnetic Behavior with Coercivity (Hc) 842 Oe. while the Values of Magnetic Saturation (MS) and Remanace (Mr) Were Found in Range 3.90emu/g and 1.07emu/g.