Controlled Deposition and Electrical Characterization of Multi-Wall Carbon Nanotubes |
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| Journal | Journal of Nano Research (Volume 3) |
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| Volume | Journal of Nano Research Vol. 3 |
| Pages | 25-32 |
| DOI | 10.4028/www.scientific.net/JNanoR.3.25 |
| Citation | S.A. Moshkalev et al., 2008, Journal of Nano Research, 3, 25 |
| Online since | October, 2008 |
| Authors | S.A. Moshkalev, J. Leon, Carla Veríssimo, A.R. Vaz, A. Flacker, M.B. de Moraes, J.W. Swart |
| Keywords | Dielectrophoresis, Electroless, Focused Ion Beam, Multiwalled Carbon Nanotubes, Resistance |
| Abstract | A method of ac dielectrophoresis was applied to align and deposit metallic multi-wall carbon nanotubes between pre-fabricated metal (Au, Pd) electrodes with a micron scale separation. For improvement of nanotube contacts with electrodes, Ni and Pd electroless processes were developed, and significant reduction of 2 terminals resistances was demonstrated. Further, using electron and ion beam deposited Pt contacts in two different configurations (“Pt-on-CNT” and “CNT-on-Pt”), 4 terminals measurements have been performed to evaluate intrinsic nanotube resistances. The values between 90 and 130 kΩ/μm were obtained, while systematically lower values (30-70 kΩ/μm) were estimated using 2 terminals method. The 4 terminals method was applied to study the effect of ion irradiation on the electrical parameters of supported nanotubes. |
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