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Controlled Deposition and Electrical Characterization of Multi-Wall Carbon Nanotubes

Journal Journal of Nano Research (Volume 3)
Volume Journal of Nano Research Vol. 3
Pages 25-32
DOI 10.4028/www.scientific.net/JNanoR.3.25
Citation S.A. Moshkalev et al., 2008, Journal of Nano Research, 3, 25
Online since October, 2008
Authors S.A. Moshkalev, J. Leon, Carla Veríssimo, A.R. Vaz, A. Flacker, M.B. de Moraes, J.W. Swart
Keywords Dielectrophoresis, Electroless, Focused Ion Beam, Multiwalled Carbon Nanotubes, Resistance
Abstract

A method of ac dielectrophoresis was applied to align and deposit metallic multi-wall carbon nanotubes between pre-fabricated metal (Au, Pd) electrodes with a micron scale separation. For improvement of nanotube contacts with electrodes, Ni and Pd electroless processes were developed, and significant reduction of 2 terminals resistances was demonstrated. Further, using electron and ion beam deposited Pt contacts in two different configurations (“Pt-on-CNT” and “CNT-on-Pt”), 4 terminals measurements have been performed to evaluate intrinsic nanotube resistances. The values between 90 and 130 kΩ/μm were obtained, while systematically lower values (30-70 kΩ/μm) were estimated using 2 terminals method. The 4 terminals method was applied to study the effect of ion irradiation on the electrical parameters of supported nanotubes.

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