X-Ray Diffraction Studies of Nanostructured Metallic Alloys
|Periodical||Journal of Nano Research (Volume 3)|
|Main Theme||Journal of Nano Research Vol. 3|
|Citation||H. Bedboudi et al., 2008, Journal of Nano Research, 3, 45|
|Online since||October, 2008|
|Authors||H. Bedboudi, A. Bourbia, M. Draissia, M.Y. Debili|
|Keywords||Al-Based Alloy, Microstructure Parameter, Nanostructured Materials, X-Ray Characterization|
X-ray tools are being powerful methods for qualitative and quantitative analyses of nanocrystalline materials This work is an overview of detailed X-ray investigations relative to microstructural studies applied for a refined binary Al-based alloys thin films system as samples deposited on glass substrates. Energy dispersive analysis of X-ray (EDAX), X-ray diffraction (XRD) and transmission electron microscopy (TEM) methods were used to determine the chemical composition, the microstructure parameters and the solubility of copper in aluminum.