Dislocation Microstructure and Residual Long-Range Internal Stresses in Wire-Drawn Cu Single Crystals |
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| Journal | Key Engineering Materials (Volume 103) |
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| Volume | Nonequilibrium Materials |
| Edited by | J. Lendvai |
| Pages | 211-216 |
| DOI | 10.4028/www.scientific.net/KEM.103.211 |
| Citation | A. Borbély et al., 1995, Key Engineering Materials, 103, 211 |
| Authors | A. Borbély, G. Hoffmann, Tamás Ungár |
| Keywords | Dislocation Density, Long-Range Internal Stresses, Wire-Drawing, X-Ray Line Profile |
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