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In Situ Observation of Oxide Films Formed during Thermal Oxidation of SiC-B4C Composite Using Raman Spectroscopy

Journal Key Engineering Materials (Volume 113)
Volume Corrosion of Advanced Ceramics
Edited by R.J. Fordham, D.J. Baxter and T. Graziani
Pages 99-104
DOI 10.4028/www.scientific.net/KEM.113.99
Citation Takayuki Narushima et al., 1995, Key Engineering Materials, 113, 99
Authors Takayuki Narushima, Miho Maruyama, H. Arashi, Takashi Goto, Toshio Hirai, Yasutaka Iguchi
Keywords In Situ Observation, Boron Carbide, Oxidation, Raman Spectroscopy, Silicon Carbide (SiC)
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