Paper Title:
SiC/SiC Interface Characterisation Using Nanoindentation Techniques
  Abstract

  Info
Periodical
Key Engineering Materials (Volumes 127-131)
Edited by
M. Fuentes, J.M. Martínez-Esnaola, A.M. Daniel
Pages
609-616
DOI
10.4028/www.scientific.net/KEM.127-131.609
Citation
M.R. Elizalde, A.M. Daniel, J.M. Martínez-Esnaola, "SiC/SiC Interface Characterisation Using Nanoindentation Techniques", Key Engineering Materials, Vols. 127-131, pp. 609-616, 1997
Online since
November 1996
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Price
$32.00
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