Paper Title:
SAW Materials and Devices Characterization of High Resolution and Accuracy
  Abstract

  Info
Periodical
Key Engineering Materials (Volumes 132-136)
Main Theme
Edited by
P. Abelard, J. Baxter, D. Bortzmeyer et al.
Pages
1147-1150
DOI
10.4028/www.scientific.net/KEM.132-136.1147
Citation
M. Weihnacht, K. Franke, K. Kunze, H. Schmidt, "SAW Materials and Devices Characterization of High Resolution and Accuracy", Key Engineering Materials, Vols. 132-136, pp. 1147-1150, 1997
Online since
April 1997
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Price
$32.00
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