Paper Title:
SIMS Study of Amorphous Carbon Films Deposited on Silicon and TA6V Substrates
  Abstract

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Periodical
Key Engineering Materials (Volumes 132-136)
Main Theme
Edited by
P. Abelard, J. Baxter, D. Bortzmeyer et al.
Pages
1540-1543
DOI
10.4028/www.scientific.net/KEM.132-136.1540
Citation
C. Tixier, M. Cahoreau, J. Desmaison, "SIMS Study of Amorphous Carbon Films Deposited on Silicon and TA6V Substrates", Key Engineering Materials, Vols. 132-136, pp. 1540-1543, 1997
Online since
April 1997
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Price
$32.00
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