Paper Title:
Characterization of Multilayer Ceramic Membranes with the Atomic Force Microscope
  Abstract

  Info
Periodical
Key Engineering Materials (Volumes 132-136)
Main Theme
Edited by
P. Abelard, J. Baxter, D. Bortzmeyer et al.
Pages
1707-1710
DOI
10.4028/www.scientific.net/KEM.132-136.1707
Citation
H. Guldberg-Pedersen, J. Tranto, J. Weiland Høj, "Characterization of Multilayer Ceramic Membranes with the Atomic Force Microscope", Key Engineering Materials, Vols. 132-136, pp. 1707-1710, 1997
Online since
April 1997
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Price
$32.00
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