Paper Title:
Observation of Different Interfaces in Silicon Nitride by HRTEM. Influence of the Microstructure on the Creep Properties.
  Abstract

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Periodical
Key Engineering Materials (Volumes 132-136)
Main Theme
Edited by
P. Abelard, J. Baxter, D. Bortzmeyer et al.
Pages
559-562
DOI
10.4028/www.scientific.net/KEM.132-136.559
Citation
G. Bernard-Granger, B. Calès, R. Duclos, J. Crampon, "Observation of Different Interfaces in Silicon Nitride by HRTEM. Influence of the Microstructure on the Creep Properties.", Key Engineering Materials, Vols. 132-136, pp. 559-562, 1997
Online since
April 1997
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Price
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