Paper Title:
Rheological Analysis of Stress-Strain Hysteresis in Silicon Nitride at High Temperature
  Abstract

  Info
Periodical
Key Engineering Materials (Volumes 132-136)
Main Theme
Edited by
P. Abelard, J. Baxter, D. Bortzmeyer et al.
Pages
694-697
DOI
10.4028/www.scientific.net/KEM.132-136.694
Citation
G. Roebben, M. Steen, O. Van der Biest, "Rheological Analysis of Stress-Strain Hysteresis in Silicon Nitride at High Temperature", Key Engineering Materials, Vols. 132-136, pp. 694-697, 1997
Online since
April 1997
Export
Price
$32.00
Share

In order to see related information, you need to Login.

In order to see related information, you need to Login.