Paper Title:
AFM Investigation of Electrical Double Layers on SiO2 Surfaces
  Abstract

  Info
Periodical
Key Engineering Materials (Volumes 132-136)
Main Theme
Edited by
P. Abelard, J. Baxter, D. Bortzmeyer et al.
Pages
726-729
DOI
10.4028/www.scientific.net/KEM.132-136.726
Citation
G. Hüttl, D. Beyer, E. Müller, "AFM Investigation of Electrical Double Layers on SiO2 Surfaces", Key Engineering Materials, Vols. 132-136, pp. 726-729, 1997
Online since
April 1997
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Price
$32.00
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