Materials Science & Technology

FULLTEXT SEARCH
NEW: Advanced Search

Characterisation of an X-Ray System with GaAs Detector for Composite Material Analysis

Journal Key Engineering Materials (Volume 144)
Volume Experimental Techniques and Design in Composite Materials 3
Edited by Pierluigi Priolo
Pages 261-272
DOI 10.4028/www.scientific.net/KEM.144.261
Citation F. Bertolino et al., 1997, Key Engineering Materials, 144, 261
Authors F. Bertolino, G. Gatto, F. Ginesu, P. Randaccio
Keywords Defect Analysis, Microtomography
Full Paper PDF Get the full paper by clicking here

First page example

Preview of first page