Emission of an Edge Dislocation from a Thin-Film-Covered Crack |
| Journal |
Key Engineering Materials (Volumes 145 - 149) |
| Volume |
Fracture and Strength of Solids III |
| Edited by |
P. Tong, T.Y. Zhang and J.K. Kim |
| Pages |
161-166 |
| DOI |
10.4028/www.scientific.net/KEM.145-149.161 |
| Citation |
C.-F. Qian et al., 1997, Key Engineering Materials, 145-149, 161 |
| Authors |
C.-F. Qian, Tong Yi Zhang, Pin Tong |
| Keywords |
Edge Dislocation Emission, Fracture, Stress Corrosion Cracking, Stress Intensity Factor (SIF), Thin Film |
| Full Paper |
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