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Characterization of Oxide Layers Deposited by Sol-Gel

Journal Key Engineering Materials (Volume 150)
Volume Sol-Gel Production
Edited by Helmut Schmidt
Pages 21-32
DOI 10.4028/www.scientific.net/KEM.150.21
Citation K. Bange, 1998, Key Engineering Materials, 150, 21
Authors K. Bange
Keywords Composition, Density, Oxide Films, SiO2, Sol-Gel, Stress, Thin Film Analysis, Titania (TiO2)
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