Paper Title:
Study of Crystallographic Orientation of in situ β-Si3N4 Composite by Electron Back Scattered Diffraction (EBSD) Method
  Abstract

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Periodical
Key Engineering Materials (Volumes 161-163)
Edited by
K. Niihara, T. Sekino, E. Yasuda, T. Sasa
Pages
31-34
DOI
10.4028/www.scientific.net/KEM.161-163.31
Citation
Y. Yasutomi, Y. Sakaida, N. Hirosaki, Y. Ikuhara, "Study of Crystallographic Orientation of in situ β-Si3N4 Composite by Electron Back Scattered Diffraction (EBSD) Method", Key Engineering Materials, Vols. 161-163, pp. 31-34, 1999
Online since
July 1998
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Price
$35.00
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