Evaluation of Single Grain Boundaries in ZnO:Rare-Earth Varistor by Photo-ICTS |
| Journal |
Key Engineering Materials (Volumes 169 - 170) |
| Volume |
Electroceramics in Japan II |
| Edited by |
N. Mizutani, K. Shinozaki, N. Kamehara, T. Kimura |
| Pages |
105-108 |
| DOI |
10.4028/www.scientific.net/KEM.169-170.105 |
| Citation |
A. Tanaka et al., 1999, Key Engineering Materials, 169-170, 105 |
| Authors |
A. Tanaka, K. Mukae |
| Keywords |
Interface States (or Traps), Optical Cross Section, Photo-ICTS, Varistors |
| Full Paper |
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