Nonuniformity of the Electrical Properties in SiC Micro Thermistors |
| Journal |
Key Engineering Materials (Volumes 169 - 170) |
| Volume |
Electroceramics in Japan II |
| Edited by |
N. Mizutani, K. Shinozaki, N. Kamehara, T. Kimura |
| Pages |
75-78 |
| DOI |
10.4028/www.scientific.net/KEM.169-170.75 |
| Citation |
T. Terashige et al., 1999, Key Engineering Materials, 169-170, 75 |
| Authors |
T. Terashige, K. Okano |
| Keywords |
Electrical Property, Microstructure, Non-Uniformity, Silicon Carbide (SiC), Thermistor |
| Full Paper |
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