Dislocation Structure and Activated Slip Systems in β-Silicon Nitride during High Temperature Deformation |
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| Journal | Key Engineering Materials (Volumes 171 - 174) |
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| Volume | Creep and Fracture of Engineering Materials and Structures |
| Edited by | T. Sakuma, K. Yagi |
| Pages | 825-832 |
| DOI | 10.4028/www.scientific.net/KEM.171-174.825 |
| Citation | Koichi Kawahara et al., 1999, Key Engineering Materials, 171-174, 825 |
| Authors | Koichi Kawahara, Sadahiro Tsurekawa, H. Nakashima |
| Keywords | High Temperature Deformation, Slip Systems, Weak-Beam Method |
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