Paper Title:
Transmission Electron Microscope Observation of Creep Deformed Al2O3, SiC and Si3N4 Ceramics
  Abstract

  Info
Periodical
Key Engineering Materials (Volumes 171-174)
Edited by
T. Sakuma, K. Yagi
Pages
833-840
DOI
10.4028/www.scientific.net/KEM.171-174.833
Citation
T. Yano, A.T. Yokobori Jr., "Transmission Electron Microscope Observation of Creep Deformed Al2O3, SiC and Si3N4 Ceramics", Key Engineering Materials, Vols. 171-174, pp. 833-840, 2000
Online since
October 1999
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Price
$32.00
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