Transmission Electron Microscope Observation of Creep Deformed Al2O3, SiC and Si3N4 Ceramics |
| Journal |
Key Engineering Materials (Volumes 171 - 174) |
| Volume |
Creep and Fracture of Engineering Materials and Structures |
| Edited by |
T. Sakuma, K. Yagi |
| Pages |
833-840 |
| DOI |
10.4028/www.scientific.net/KEM.171-174.833 |
| Citation |
Toyohiko Yano et al., 1999, Key Engineering Materials, 171-174, 833 |
| Authors |
Toyohiko Yano, A.Toshimitsu Yokobori |
| Keywords |
Al2O3, Creep, Silicon Carbide (SiC), TEM |
| Full Paper |
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