Influence of Firing Temperature on the Microstructure and Electrical Properties of BTZ Based Dielectric Material for Ni-MLCC |
| Journal |
Key Engineering Materials (Volumes 181 - 182) |
| Volume |
Electroceramics in Japan III |
| Edited by |
N. Murata, K. Shinozaki and T. Kimura |
| Pages |
11-14 |
| DOI |
10.4028/www.scientific.net/KEM.181-182.11 |
| Citation |
Hirokazu Chazono et al., 2000, Key Engineering Materials, 181-182, 11 |
| Authors |
Hirokazu Chazono, Yasuyuki Inomata, Noriyuki Kohzu, Hiroshi Kishi |
| Keywords |
Ba(Ti,Zr)O3, Dielectric Relaxation, Direct Current Bias, Multilayer Ceramic Capacitors, Redox Behavior |
| Full Paper |
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