Fracture and Strength of Solids IV
Key Engineering Materials Volumes 183 - 187
doi:10.4028/www.scientific.net/KEM.183-187
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p1
Length-Scale Effects in Nano- and Micro-Mechanics of Solids
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384 K
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Authors: Kyung Suk Kim, Juan A. Hurtado
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p9
Mechanism-Based Strain Gradient (MSG) Plasticity and the Associated Asymptotic Crack-Tip Fields
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450 K
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Authors: Keh Chih Hwang, Yonggang Y. Huang
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p19
An Analysis of Fatigue Crack Growth Rate Considering Spatial Variation of Fatigue Crack Growth Resistance
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259 K
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Authors: Seon Jin Kim
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p25
Rectangular Array and Zig-Zag Array of Elliptical Holes in Solids under Uniaxial Tension (Formulae of Maximum Stresses and Tensile Stiffnesses)
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206 K
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Authors: H. Igawa
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p31
Crack Growth in Stainless Steel 304AT 538°C under Fatigue Loading with and without Hold Time
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322 K
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Authors: Y.M. Baik, K.S. Kim
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p37
An Inverse Fracture Problem of a Shear Specimen with Double Cracks
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249 K
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Authors: You Tang Li, Zhi Yuan Rui, Jian Long Huang
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p43
Fracture Mechanics Analysis of Cracked Plate Repaired by Composite Patch
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270 K
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Authors: Kwang Hwa Chung, Won Ho Yang, Myoung Rae Cho
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p49
Fracture Toughness Test of Small CNS Specimen with an Interface Crack Subjected to Mixed-Mode Loading
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200 K
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Authors: Kenji Machida
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p55
Theoretical Investigation of Controllable & Regular Fracture Theory
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294 K
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Authors: Aixi Zhou, Yao Bing Wei, Fu Yuan Lang
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p61
Crack Identification Using Classical Optimization Technique
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245 K
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Authors: M.W. Suh, J.M. Yu, Je Hyeng Lee
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p67
Study on Strength of Rock Material under Dynamic Triaxial Compressive Loads Based on Sliding Crack Model
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228 K
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Authors: Hai Bo Li, Ting Jie Li, J. Zhao, J.G. Gao, J.G. Jiang
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p73
Kinking out of a Mixed Mode Interface Crack
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214 K
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Authors: T. Ikeda, Y. Komohara, A. Nakamura, N. Miyazaki
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p79
Global Crack-Line Displacement Fitting Procedure: Edge Cracks
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280 K
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Authors: H.Y. Jiang, Z.L. Li, F.L. Zhan
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p85
A Stochastic Modeling for Predicting Fatigue Crack Growth under Variable Amplitude Loading
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300 K
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Authors: D.S. Shim, Jung Kyu Kim
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p91
A Highly Accurate BEM in Fracture Mechanics
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251 K
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Authors: Z.L. Li, F.L. Zhan, S.H. Du