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Characterisation of Modified Sputtered (TiAl)-Based Intermetallic Materials Doped with Silver and Chromium

Journal Key Engineering Materials (Volume 188)
Volume Development in Light Metals
Edited by F.H. Froes and E. Evangelista
Pages 37-44
DOI 10.4028/www.scientific.net/KEM.188.37
Authors C. Coelho, Ana Sofia Ramos, Bruno Trindade, M. Teresa Vieira, José Valdemar Fernandes, M. Vieira
Keywords Additional Elements, Thin Film, Titanium-Aluminide, γ-Phase
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