Characterisation of Modified Sputtered (TiAl)-Based Intermetallic Materials Doped with Silver and Chromium |
| Journal |
Key Engineering Materials (Volume 188) |
| Volume |
Development in Light Metals |
| Edited by |
F.H. Froes and E. Evangelista |
| Pages |
37-44 |
| DOI |
10.4028/www.scientific.net/KEM.188.37 |
| Citation |
C. Coelho et al., 2000, Key Engineering Materials, 188, 37 |
| Authors |
C. Coelho, Ana Sofia Ramos, Bruno Trindade, M. Teresa Vieira, José Valdemar Fernandes, M. Vieira |
| Keywords |
Additional Elements, Thin Film, Titanium Aluminides, γ-Phase |
| Full Paper |
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