Paper Title:
Measurements of Surface Residual Stresses in Si3N4 Based Laminates by Raman Spectroscopy
  Abstract

  Info
Periodical
Key Engineering Materials (Volumes 206-213)
Main Theme
Edited by
C. Kermel, V. Lardot, D. Libert and I. Urbain
Pages
1025-1028
DOI
10.4028/www.scientific.net/KEM.206-213.1025
Citation
N. Orlovskaya, Y.G. Gogotsi, "Measurements of Surface Residual Stresses in Si3N4 Based Laminates by Raman Spectroscopy", Key Engineering Materials, Vols. 206-213, pp. 1025-1028, 2002
Online since
December 2001
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Price
$32.00
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