Paper Title:
Effects of Low-Temperature Annealing on the Microstructure and Electrical Properties of Doped-ZnO Varistors
  Abstract

  Info
Periodical
Key Engineering Materials (Volumes 206-213)
Main Theme
Edited by
C. Kermel, V. Lardot, D. Libert and I. Urbain
Pages
1389-1392
DOI
10.4028/www.scientific.net/KEM.206-213.1389
Citation
P. Durán, F. Capel, J. Tartaj, C. Moure, "Effects of Low-Temperature Annealing on the Microstructure and Electrical Properties of Doped-ZnO Varistors", Key Engineering Materials, Vols. 206-213, pp. 1389-1392, 2002
Online since
December 2001
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Price
$32.00
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