Paper Title:
In-Situ High Temperature Study of Ceramics and Ceramic Ultra-Thin Films Using a X-Ray Diffractometer with a Parabolic Multilayer Mirror
  Abstract

  Info
Periodical
Key Engineering Materials (Volumes 206-213)
Main Theme
Edited by
C. Kermel, V. Lardot, D. Libert and I. Urbain
Pages
775-778
DOI
10.4028/www.scientific.net/KEM.206-213.775
Citation
G. Roebben, C. Zhao, R.-G. Duan, J. Vleugels, M. M. Heyns, O. Van der Biest, "In-Situ High Temperature Study of Ceramics and Ceramic Ultra-Thin Films Using a X-Ray Diffractometer with a Parabolic Multilayer Mirror", Key Engineering Materials, Vols. 206-213, pp. 775-778, 2002
Online since
December 2001
Export
Price
$32.00
Share

In order to see related information, you need to Login.

In order to see related information, you need to Login.