Paper Title:
Effects of Deposition Temperature on Structure and Resistivity of Epitaxial La0.5Sr0.5CoO3/CeO2/YSZ/Si(001) Films
  Abstract

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Periodical
Key Engineering Materials (Volumes 214-215)
Edited by
M. Murata, K. Koumoto and T. Takenaka, S. Fujitsu
Pages
177-182
DOI
10.4028/www.scientific.net/KEM.214-215.177
Citation
C. H. Chen, N. Wakiya, K. Shinozaki, N. Mizutani, "Effects of Deposition Temperature on Structure and Resistivity of Epitaxial La0.5Sr0.5CoO3/CeO2/YSZ/Si(001) Films", Key Engineering Materials, Vols. 214-215, pp. 177-182, 2002
Online since
July 2001
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Price
$32.00
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