Suppression of Interface Migration and Improvement of Dielectric Properties in SrTiO3-Based Materials |
| Journal |
Key Engineering Materials (Volumes 214 - 215) |
| Volume |
Asian Ceramic Science for Electronics I |
| Edited by |
M. Murata, K. Koumoto and T. Takenaka, S. Fujitsu |
| Pages |
61-66 |
| DOI |
10.4028/www.scientific.net/KEM.214-215.61 |
| Citation |
Joo Sun Kim et al., 2001, Key Engineering Materials, 214-215, 61 |
| Authors |
Joo Sun Kim, Sang Yoon Koo, Suk Joong L. Kang |
| Keywords |
Barrier Layer Capacitor, Dielectric Properties, Diffusion Induced Grain Boundary Migration DIGM, Infiltration, Strontium Titanate |
| Full Paper |
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