Paper Title:
Depth-Profiling of Phase Composition and Texture in Layered-Graded Al2O3- & Ti3SiC2-Based Systems Using X-Ray and Synchrotron Radiation Diffraction
| Periodical |
Key Engineering Materials (Volumes 224 - 226)
|
| Main Theme |
High-Performance Ceramics 2001
|
| Edited by |
Jianghong Gong and Wei Pan |
| Pages |
505-510 |
| DOI |
10.4028/www.scientific.net/KEM.224-226.505 |
| Citation |
I.M. Low et al., 2002, Key Engineering Materials, 224-226, 505 |
| Authors |
I.M. Low, M. Singh, P. Manurung, E. Wren, D.P. Sheppard, M.W. Barsoum |
| Keywords |
Depth Profiling, Grazing Incidence, Layered-Graded, Synchrotron Radiation Diffraction |
| Price |
US$ 28,- |