Paper Title:
Depth-Profiling of Phase Composition and Texture in Layered-Graded Al2O3- & Ti3SiC2-Based Systems Using X-Ray and Synchrotron Radiation Diffraction
  Abstract

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Periodical
Key Engineering Materials (Volumes 224-226)
Edited by
Jianghong Gong and Wei Pan
Pages
505-510
DOI
10.4028/www.scientific.net/KEM.224-226.505
Citation
I. M. Low, M. Singh, P. Manurung, E. Wren, D.P. Sheppard, M.W. Barsoum, "Depth-Profiling of Phase Composition and Texture in Layered-Graded Al2O3- & Ti3SiC2-Based Systems Using X-Ray and Synchrotron Radiation Diffraction", Key Engineering Materials, Vols. 224-226, pp. 505-510, 2002
Online since
June 2002
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Price
$32.00
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