Paper Title:

Depth-Profiling of Phase Composition and Texture in Layered-Graded Al2O3- & Ti3SiC2-Based Systems Using X-Ray and Synchrotron Radiation Diffraction

Periodical Key Engineering Materials (Volumes 224 - 226)
Main Theme High-Performance Ceramics 2001
Edited by Jianghong Gong and Wei Pan
Pages 505-510
DOI 10.4028/www.scientific.net/KEM.224-226.505
Citation I.M. Low et al., 2002, Key Engineering Materials, 224-226, 505
Authors I.M. Low, M. Singh, P. Manurung, E. Wren, D.P. Sheppard, M.W. Barsoum
Keywords Depth Profiling, Grazing Incidence, Layered-Graded, Synchrotron Radiation Diffraction
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