Novel Methods to Measure Residual Stresses in Thin Films |
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| Journal | Key Engineering Materials (Volume 227) |
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| Volume | Modeling of Materials |
| Edited by | C.-h. Chiu, Z. Chen, H. Gao, K.Y. Lam, A.A.O. Tay |
| Pages | 31-40 |
| DOI | 10.4028/www.scientific.net/KEM.227.31 |
| Citation | Tong Yi Zhang, 2002, Key Engineering Materials, 227, 31 |
| Authors | Tong Yi Zhang |
| Keywords | Indentation Fracture Tests, Microbridge Tests, Micro-Rotating-Structures, Residual Stress, Thin Film |
| Full Paper | 
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