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Popcorn Failure and Unstable Void Growth in Plastic Electronic Packages

Journal Key Engineering Materials (Volume 227)
Volume Modeling of Materials
Edited by C.-h. Chiu, Z. Chen, H. Gao, K.Y. Lam, A.A.O. Tay
Pages 61-66
DOI 10.4028/www.scientific.net/KEM.227.61
Authors C.W. Chong, T.F. Guo, Lin Cheng
Keywords Finite Element Analysis (FEA), IC Packages, Multiaxial Straining, Popcorn Failure, Unstable Void Growth
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