Asian Ceramic Science for Electronics II and Electroceramics in Japan V
Key Engineering Materials Volumes 228 - 229
doi:10.4028/www.scientific.net/KEM.228-229
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p3
Pyroelectric Ceramics in PbZrO3-PbTiO3-Pb(Zn1/3Nb2/3)O3 System Prepared with Spark Plasma Sintering Technique
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223 K
]
Authors: Yong Jun Wu, Naofumi Uekawa, Kazuyuki Kakegawa, Yoshinori Sasaki
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p9
Material Constans and their Temperature Dependence in Pb(Zn1/3Nb2/3)0.91Ti0.09O3 Single Crystal
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187 K
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Authors: Yoshiki Numamoto, Yoshiaki Yamauchi, Toshio Ogawa, Mitsuyoshi Matsushita, Yoshihito Tachi
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p15
Microstructure and Dielectric Properties of PZN-PT-BT Relaxor Ferroelectric Ceramics
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296 K
]
Authors: Xiao Li Wang, Zhengkui Xu, Haydn Chen
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p21
Preparation of Grain Oriented BNKT-Based Perovskite Solid Solutions
[
252 K
]
Authors: Yuichi Abe, Toshio Kimura
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p27
Piezoelectric Properties of Nb-Doped Bi4Ti3O12 Ferroelectric Ceramics
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223 K
]
Authors: Hajime Nagata, Yuzuru Yano, Gentaro Takeda, Tadashi Takenaka
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p31
Piezoelectric Multilayer Microactuators for High Track Density Hard Disk Drives
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346 K
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Authors: Weiguang Zhu, Zhi Hong Wang, Kui Yao, Xi Yao
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p37
Microstructure-Property Linkages in Multi-Phase Electroceramics
[
375 K
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Authors: Ce Wen Nan, Yuan Hua Lin
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p43
Effect of Bond Valence on Microwave Dielectric Properties of Ca2/5Sm2/5TiO3-Li1/2Nd1/2TiO3 Ceramics
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225 K
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Authors: Eung Soo Kim, Ki Hyun Yoon, Woo Sup Kim
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p49
Mixture Behavior and Microwave Dielectric Properties in the CeO2-V2O5 System
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224 K
]
Authors: Duck Hwan Kim, Chul An
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p57
Surface Decoration for Sol-Gel Derived Ferroelectric Pb(Zr0.52Ti0.48)O3 Thin Films
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213 K
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Authors: Xu Sheng Wang, Hiroshi Ishiwara
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p63
Dielectric, Ferroelectric, Piezoelectric Properties of Highly Oriented Pb(Zr0.3Ti0.7)O3 Thin Films
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266 K
]
Authors: Desheng Fu, Yasutaka Yoshimi, Hisao Suzuki, Kenji Ishikawa
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p69
Ferroelectricity of Epitaxial and Polycrystalline PZT Films Prepared by Pulsed-MOCVD
[
237 K
]
Authors: Hiroshi Funakubo, Takahiro Oikawa, Kuniharu Nagashima, Masanori Aratani, Keisuke Saito
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p75
Preparation and Properties of Novel Heteroepitaxial Metal/Ferroelectric/Metal/Insulator/Semiconductor (MFMIS) Structure for Pt/Pb(Zr,Ti)O3/(La,Sr)CoO3/SrTiO3/(Ni,Zn,Fe)Fe2O4/(MgO-Al2O3)/CeO2/YSZ/Si Thin Films
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284 K
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Authors: Naoki Wakiya, Kazuo Shinozaki, Nobuyasu Mizutani
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p81
Ferroelectric and Dielectric Properties of (Bi,La)4Ti3O12/Pb(Zr,Ti)O3 Multilayer Thin Films on LaNiO3-Coated Pt/Ti/SiO2/Si Substrates
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256 K
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Authors: Dinghua Bao, Naoki Wakiya, Kazuo Shinozaki, Nobuyasu Mizutani
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p87
Film Thickness Dependence of Structural and Dielectric Properties of Pb(Mg1/3Nb2/3)O3/BaTiO3/Pt/Ti/SiO2/Si
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246 K
]
Authors: Chun Hua Chen, Naoki Wakiya, Kazuo Shinozaki, Nobuyasu Mizutani