Mixture Behavior and Microwave Dielectric Properties in the CeO2-V2O5 System |
| Journal |
Key Engineering Materials (Volumes 228 - 229) |
| Volume |
Asian Ceramic Science for Electronics II and Electroceramics in Japan V |
| Edited by |
T. Kimura, K. Koumoto, T. Takenaka, S. Fujitsu, K. Shinozaki |
| Pages |
49-56 |
| DOI |
10.4028/www.scientific.net/KEM.228-229.49 |
| Citation |
Duck Hwan Kim et al., 2002, Key Engineering Materials, 228-229, 49 |
| Authors |
Duck Hwan Kim, Chul An |
| Keywords |
CeO2, Dielectric Constant, Q*f, Sintering Temperature, Temperature Coefficient of the Resonant Frequency, V2O5 |
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