Film Thickness Dependence of Structural and Dielectric Properties of Pb(Mg1/3Nb2/3)O3/BaTiO3/Pt/Ti/SiO2/Si |
| Journal |
Key Engineering Materials (Volumes 228 - 229) |
| Volume |
Asian Ceramic Science for Electronics II and Electroceramics in Japan V |
| Edited by |
T. Kimura, K. Koumoto, T. Takenaka, S. Fujitsu, K. Shinozaki |
| Pages |
87-92 |
| DOI |
10.4028/www.scientific.net/KEM.228-229.87 |
| Citation |
Chun Hua Chen et al., 2002, Key Engineering Materials, 228-229, 87 |
| Authors |
Chun Hua Chen, Naoki Wakiya, Kazuo Shinozaki, Nobuyasu Mizutani |
| Keywords |
Grazing X-Ray Diffraction, PLD, Thermal Expansion |
| Full Paper |
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