Paper Title:
Film Thickness Dependence of Structural and Dielectric Properties of Pb(Mg1/3Nb2/3)O3/BaTiO3/Pt/Ti/SiO2/Si
  Abstract

  Info
Periodical
Key Engineering Materials (Volumes 228-229)
Edited by
T. Kimura, K. Koumoto, T. Takenaka, S. Fujitsu, K. Shinozaki
Pages
87-92
DOI
10.4028/www.scientific.net/KEM.228-229.87
Citation
C. H. Chen, N. Wakiya, K. Shinozaki, N. Mizutani, "Film Thickness Dependence of Structural and Dielectric Properties of Pb(Mg1/3Nb2/3)O3/BaTiO3/Pt/Ti/SiO2/Si", Key Engineering Materials, Vols. 228-229, pp. 87-92, 2002
Online since
September 2002
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Price
$32.00
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