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Preparation and Characterization of Layer-Structured Perovskite CaXBi4-XTi3O12-X/2 (X = 1, 2) Thin Films

Journal Key Engineering Materials (Volumes 228 - 229)
Volume Asian Ceramic Science for Electronics II and Electroceramics in Japan V
Edited by T. Kimura, K. Koumoto, T. Takenaka, S. Fujitsu, K. Shinozaki
Pages 93-98
DOI 10.4028/www.scientific.net/KEM.228-229.93
Citation Kazumi Kato et al., 2002, Key Engineering Materials, 228-229, 93
Authors Kazumi Kato, Kazuyuki Suzuki, Kaori Nishizawa, Takeshi Miki
Keywords A-Site Substitution, Bi-Based Layer-Structured Perovskite, Chemical Solution Deposition CSD, Fatigue Behaviour, Ferroelectric Thin Film, Metal Alkoxides, P-E Hysteresis Properties
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