Paper Title:
Very Low Frequency Dielectric Relaxation Deduced from Time Domain Measurements
  Abstract

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Periodical
Key Engineering Materials (Volumes 230-232)
Edited by
Teresa Vieira
Pages
579-582
DOI
10.4028/www.scientific.net/KEM.230-232.579
Citation
E. R. Neagu, J. N. Marat-Mendes, C.J. Dias, R. M. Neagu, "Very Low Frequency Dielectric Relaxation Deduced from Time Domain Measurements", Key Engineering Materials, Vols. 230-232, pp. 579-582, 2002
Online since
October 2002
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