Paper Title:
Nano-Topography Characterization of Axisymmetrical Aspherical Ground Surfaces
  Abstract

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Periodical
Key Engineering Materials (Volumes 238-239)
Edited by
Yongsheng Gao, Jun'ichi Tamaki and Koichi Kitajima
Pages
125-130
DOI
10.4028/www.scientific.net/KEM.238-239.125
Citation
T. Kuriyagawa, N. Yoshihara, M. Saeki, K. Syoji, "Nano-Topography Characterization of Axisymmetrical Aspherical Ground Surfaces", Key Engineering Materials, Vols. 238-239, pp. 125-130, 2003
Online since
April 2003
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Price
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